Sample destructive Technique

  • Destructive Testing

    caleb-charles

    Member
    28/11/2021 at 4:12 pm

    The secondary ion mass spectrometry (SIMS) analysis is destructive technique (sacrifices the surface particles that are analyzed by the mass spectrometer) for analyzing the mass/charge ratio of ionized particles produced from the sample upon bombardment of an energetic (25 keV) primary ion beam (Bi+, Cs+, C60+).

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0 of 0 replies June 2018
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