Destructive Testing
Destructive Testing
Sample destructive Technique
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Sample destructive Technique
Sample destructive Technique
Hi,
Tell me which is sample destructive technique in spectroscopy? -
1 Reply
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The secondary ion mass spectrometry (SIMS) analysis is destructive technique (sacrifices the surface particles that are analyzed by the mass spectrometer) for analyzing the mass/charge ratio of ionized particles produced from the sample upon bombardment of an energetic (25 keV) primary ion beam (Bi+, Cs+, C60+).
